Zentrum für Sonnenenergie- und Wasserstoff-
Forschung Baden-Württemberg
Preparation of thin layers
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The versatility, tunability, and improved properties of and with thin films make them a valuable technology with a wide range of applications.
Expertise
With its decades of experience, the Materials Research department at
ZSW is an expert for thin-film technologies:
Process development
Development of processes and customized coatings.
Layer formation
Deep knowledge of the physics and chemistry of layer formation and growth.
Process parameters
Understanding of the interplay of process parameters and layer properties in order to obtain the desired properties.
Technology transfer
Professional handling of industrial orders and technology
transfer to meet industrial challenges.
We offer
- Coatings and research and development activities
- Laboratory-scale and semi-industrial inline coatings
- Various coating processes
- Processes on various substrates (rigid, flexible)
- Coatings from nm to μm thickness, on areas from 1×1 cm² to 30×30 cm²
Processes
- Magnetron sputtering (DC, pulsed DC, RF) from rotating and planar cathodes, or RAM cathodes
- Thermal evaporation
- Electron beam evaporation
- Spin coating
- Slot-die coating (various solvents, inside or outside protective atmosphere)
- Atomic-layer deposition
- Chemical-bath deposition
- Plasma pretreatments
Examples
- Metallic layers
- Molybdenum
- Aluminium
- Titanium
- Silver
- Barriers or protective layers
- Al2O3
- SiO2
- Ti(O,N)x
- Organic layers
- PEDOT:PSS
- PTAA
- PCBM
- BCP
- Anti-reflective coatings
- MgF2
- Transparent conductive oxides (TCO), for use e.g. in solar cells
- Aluminum-doped zinc oxide (AZ0)
- Hydrogen-doped indium (IOH)
- Zinc-doped indium oxide (IZO)
- Zirconium-doped indium (IZrO)
- more upon request
Characterization of thin-film systems, surfaces and interfaces
- Optical microscopy
- Morphology (scanning electron microscopy (SEM) with EDX and FIB)
- Optical characterization (IR-UV-VIS spectroscopy (transmission, absorption, reflection))
- Layer composition (XRF)
- Depth profiling (GDOES, ToF-SIMS)
- Crystallographic characterization (XRD)
- Electrical characterization
- Further methods on request
We are happy to support you in achieving your goals.
Contact person: Dr. Stefan Paetel
✉ Stefan.Paetel@zsw-bw.de ✆ +49 711 7870237
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Location
Zentrum für Sonnenenergie- und
Wasserstoff-Forschung Baden-Württemberg
Meitnerstr. 1
70563 Stuttgart
Further information
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